Sample Curvature Cutting Polishing and Abrasion Micrograph Measurement System

The Microlab product family is designed to easily and comfortably prepare cross-sections of conductive and insulation curves within a few minutes. After the sample is cut, polished, and abraded, the image of the cross-section can be visualized on the screen. Now, a comprehensive quality control of the curvature can be performed using the specially designed image processing software X-Scan.

With a high-quality 12x zoom lens, the Microlab ML 3700 is an ideal tool for quickly and comfortably conducting quality tests. The high-resolution camera provides first-class digital color images that can be easily measured with the automatic function of the image processing software X-Scan. Automatically generated records can be used as quality proof. Of course, X-Scan meets all relevant DIN standards and OEM specifications.

Performance Features
-A complete micrograph laboratory integrated into an MDF board

-Easily operated optics with a 12x zoom lens that has an extraordinary combination of magnification and resolution

-A first-class digital color camera with a light-sensitive CMOS sensor and 5.0 megapixel resolution USB 3.0

-Very suitable for cross-sections between 0.1 and 10 mm2 (AWG 28 – AWG 10)

-Comfortable analysis software X-Scan

Optional: Integrated Cutting Camera (VCS) for precise cutting control, easily operated with a touch screen

Optional: Equipment packages with auxiliary lenses 0.25x or 0.5x for larger measurement objects

Optional: PC version including integrated mini PC ML 3700. Windows 10 prof., monitor, mouse, and keyboard license)