Sample Cutting Curvature Polishing and Abrasion Micrograph Measurement System

The Microlab product family is designed to easily and comfortably prepare cross-sections of conductive and insulation curves within a few minutes. After the sample is cut, polished, and abraded, the image of the cross-section can be visualized on the screen. Now, a comprehensive quality control of the curvature can be performed using the specially designed image processing software X-Scan.

Microlab ML 3600 is an ideal tool for performing quality tests quickly and economically. The use of proven 4x zoom optics is easy and provides very good digital color images. For analysis, you will of course use the innovative and comfortable image processing software X-Scan, which meets all relevant DIN standards and OEM specifications. Automatically generated records can be used as proof of quality.

Performance Features
– A complete micrograph laboratory integrated into a desktop card
– Excellent optics with 4 x zoom
– Superior digital color camera with a 1/2.6 “CMOS chip and 1920×1200 pixel resolution 
– Very suitable for cross-sections between 0.1 and 10 mm2 (AWG 28 – AWG 10)
– Comfortable analysis software X-Scan